The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Apr. 20, 2016
Applicant:

Farmers Edge Inc., Winnipeg, CA;

Inventors:

Guy Dion Duke, Lethbridge, CA;

Kevin John Grant, Lethbridge, CA;

Assignee:

Farmers Edge Inc., Winnipeg, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); G01N 33/24 (2006.01); G06Q 10/06 (2012.01); G06Q 50/02 (2012.01);
U.S. Cl.
CPC ...
G01D 18/00 (2013.01); G01N 33/24 (2013.01); G06Q 10/06 (2013.01); G06Q 10/0639 (2013.01); G06Q 50/02 (2013.01); G01N 2033/245 (2013.01);
Abstract

Embodiments relate to calibrating yield data points. A calibration system receives a plurality of groups of yield data points. Each group is associated with an attribute, such as, a machine identifier, a zone identifier, a localized zone identifier, and/or a moisture identifier. The system calculates a grand aggregate yield based on the yield data points of the plurality of groups. The system calculates a group aggregate yield based on yield data points of each group. The system subtracts the group aggregate yield from each yield data point of the group producing adjusted yield data points. The system adds the grand aggregate yield to each of the adjusted yield data points producing calibrated yield data points.


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Duke, Guy. (2019). Yield data calibration methods (U.S. Patent No. 10317260). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10317260

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