The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Dec. 06, 2017
Shining 3d Tech Co., Ltd., Hangzhou, Zhejiang, CN;
Xiaobo Zhao, Hangzhou, CN;
Wenbin Wang, Hangzhou, CN;
Zi Ye, Hangzhou, CN;
Chongmao Ye, Hangzhou, CN;
Jian Zhang, Hangzhou, CN;
Leijie Huang, Hangzhou, CN;
Xiaoping Xiang, Hangzhou, CN;
Shining 3D Tech Co., Ltd., Hangzhou, Zheijiang, CN;
Abstract
The present invention relates to the field of three-dimensional digital imaging, and more particularly to a three-dimensional measuring system and a measuring method with multiple measuring modes. The measuring system includes a control unit, a variable digital pattern generation unit, an image processing unit, a calculating unit and at least one image sensor; the control unit is used for controlling the cooperative work of the whole measuring system; the variable digital pattern generation unit includes a memory and a projector, and the memory stores a plurality of light template digital patterns; the image sensors are used for acquiring patterns which are projected onto a surface of a measured object; the image processing unit is a multi-mode digital image processor; and the calculating unit is a multi-mode three-dimensional point cloud calculator. The three-dimensional measuring system and the measuring method with multiple measuring modes of the present invention can implement the high-precision and high-detail three-dimensional measurement or handheld real-time measurement by switching the measuring modes, thereby having a wide application range.