The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Jan. 23, 2014
Kabushiki Kaisha Topcon, Tokyo, JP;
Zhijia Yuan, River Edge, NJ (US);
Zhenguo Wang, Fort Lee, NJ (US);
Charles A. Reisman, Mamaroneck, NY (US);
Kinpui Chan, Ridgewood, NJ (US);
Kabushiki Kaisha TOPCON, Tokyo, JP;
Abstract
Optical coherence tomography light sources can be non-linear and attempts to linearize them can lead to asynchrony between the light source and A-line scans and missampling in the scans causing signal noise. Accordingly, a system and methods are provided herein to detect missampling by obtaining a plurality of interferograms; providing at least two wavenumber reference signals at different wavenumbers, wherein the wavenumber reference signals comprise attenuated or enhanced portions of each of the plurality of interferograms; aligning each of the plurality of interferograms according to one of the at least two wavenumber reference signals; and for each of the plurality of interferograms, identifying an interferogram as missampled if another of the at least two reference signals does not align with a corresponding reference signal in a statistically significant number of the plurality of interferograms. An optical element, for example, an optical notch, may be used to generate the reference signals.