The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Jul. 07, 2014
Applicant:

Tosoh Corporation, Shunan-shi, Yamaguchi, JP;

Inventors:

Kei Inatomi, Mie, JP;

Saiki Hasegawa, Mie, JP;

Shigehiko Abe, Mie, JP;

Assignee:

TOSOH CORPORATION, Shunan, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C08F 10/02 (2006.01); C08F 110/02 (2006.01); C08F 210/16 (2006.01); C08F 4/659 (2006.01); C08F 4/6592 (2006.01);
U.S. Cl.
CPC ...
C08F 110/02 (2013.01); C08F 10/02 (2013.01); C08F 210/16 (2013.01); C08F 4/65912 (2013.01); C08F 4/65927 (2013.01);
Abstract

To provide novel ultrahigh molecular weight polyethylene particles having a high melting point and exhibiting high crystallinity, thus capable of providing a molded product excellent in mechanical strength, thermal resistance and abrasion resistance. Ultrahigh molecular weight polyethylene particles which satisfy that (1) the intrinsic viscosity (η) is at least 15 dL/g and at most 60 dL/g, (2) the bulk density is at least 130 kg/mand at most 700 kg/m, and (3) ΔTm (ΔTm=Tm−Tm) i.e. the difference between a melting point (Tm) in 1st scan and a melting point (Tm) in 2nd scan, measured by a differential scanning calorimeter (DSC), is at least 11° C. and at most 30° C.


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