The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Feb. 10, 2016
Applicant:

Nlight Inc., Vancouver, WA (US);

Inventors:

Xiaojun Li, Shanghai, CN;

R. Kirk Price, Seattle, WA (US);

Jason N. Farmer, Vancouver, WA (US);

Ethan A. McGrath, Portland, OR (US);

Assignee:

nLIGHT, Inc., Vancouver, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/18 (2006.01); B41J 2/44 (2006.01); B41M 5/26 (2006.01); B23K 26/356 (2014.01); B23K 26/359 (2014.01); B23K 26/0622 (2014.01); B23K 26/082 (2014.01); B41J 2/47 (2006.01);
U.S. Cl.
CPC ...
B23K 26/18 (2013.01); B23K 26/0622 (2015.10); B23K 26/082 (2015.10); B23K 26/356 (2015.10); B23K 26/359 (2015.10); B41J 2/442 (2013.01); B41J 2/471 (2013.01); B41M 5/262 (2013.01); Y10T 428/24802 (2015.01); Y10T 428/24917 (2015.01);
Abstract

A laser marking method and system, and laser marked object are disclosed. The method includes directing a pulsed laser beam towards an object such that an interface between an oxidized layer and non-oxidized substrate is in a mark zone of the pulsed laser beam, and scanning the pulsed laser beam across the object in a predetermined pattern to create a mark having an L value of less than 40 and a surface roughness that is substantially unchanged compared to adjacent unmarked areas. The system includes a fiber laser generating amplified pulses that are directed towards a galvo-scanner and focusing optic, while the object includes an oxidized surface layer, an underlying non-oxidized substrate, and a mark having an L value of less than 40 with substantially unchanged roughness features.


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