The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Feb. 27, 2015
The Johns Hopkins University, Baltimore, MD (US);
David L. Guyton, Baltimore, MD (US);
Kristina Irsch, Baltimore, MD (US);
Howard S. Ying, Baltimore, MD (US);
Boris I. Gramatikov, Baltimore, MD (US);
Robert Geary, Baltimore, MD (US);
Jing Tian, Parkville, MD (US);
Kurt Simons, Lutherville, MD (US);
The Johns Hopkins University, Baltimore, MD (US);
Abstract
An eye alignment monitor and method are described for the detection of variability of the relative alignment of the two eyes with each other, thereby detecting deficits of binocular function, for use as a screening device for these abnormalities especially in infants and young children. Each embodiment includes means for tracking of the positions of a subject's two eyes simultaneously, and furthermore includes repetitive calculation of the relative positions of the two eyes with respect to each other. The embodiments do not require fixation by either eye on a specific point. Typically, a movie on a video display is used for viewing by the subject. Variability of relative alignment of the two eyes with each other is typically determined by variability of the relative positions of images of the pupils of the eyes with respect to each other over time.