The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Jul. 22, 2016
National Chiao Tung University, Hsinchu, TW;
Mang Ou-Yang, Hsinchu, TW;
Jin-Chern Chiou, Hsinchu, TW;
Ting-Wei Huang, Hsinchu, TW;
Yi-Chun Tsai, Hsinchu, TW;
National Chiao Tung University, Hsinchu, TW;
Abstract
A system for measuring microfluctuation of accommodation comprises a measuring module and a processing module. The measuring module includes at least one first sensing element attached to the area around an eye of a testee for measuring an EMG signal. The processing module is coupled with the measuring module for picking up a specific frequency range of the EMG signal as a measurement index of microfluctuation of accommodation, wherein the specific frequency range is between 0.1 Hz and 100 Hz. The system allows the testee to be tested in an open field of view and exempts the testee from experiencing fatigue in the muscle around the eyes. The system is compact and convenient to carry. A method for measuring microfluctuation of accommodation is also disclosed.