The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Oct. 17, 2016
Hitachi, Ltd., Tokyo, JP;
Hiroaki Ozaki, Mountain View, CA (US);
Abhay Mehta, Austin, TX (US);
Hsiu-Khuern Tang, San Jose, CA (US);
Shuang Feng, Milpitas, CA (US);
Haiyan Wang, Fremont, CA (US);
Hitachi, Ltd., Tokyo, JP;
Abstract
In some examples, a computing device may receive sensor data for a target and at least one of: log data for the target, or historical log data and historical sensor data for a plurality of other targets. The computing device may determine at least one event classified as a non-uniform event in at least one of the log data or the historical log data, and may determine combined features, such as a feature vector, based on the sensor data and the non-uniform event(s). The computing device may determine an analysis result from the combined features. Further, based on the analysis result, the computing device may send a control signal to a device associated with the target for controlling the device, and/or may send a communication related to the target to another computing device.