The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Apr. 24, 2018
Qualcomm Incorporated, San Diego, CA (US);
Yasser Ahmed, San Diego, CA (US);
Ying Duan, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Methods, apparatus, and systems for monitoring and measuring signal characteristics for signals received over a multi-wire, multi-phase interface are disclosed. Signals present on each line of a 3-line communication interface are sampled using auxiliary samplers having a programmable time delay to delay the sampled signal by a set time, as well as a programmable voltage offset. The auxiliary sampler outputs are compared with direct line samples of signals on each of the three lines to generate error signals. From this comparison, an array of error signal data occurring over a particular sampling period may be generated. In turn, waveform characteristics can be determined from the error signal data, such as an eye-pattern. Furthermore, skew measurement may further be effectuated using the auxiliary samplers but determining the time difference of when the error signals of the different wires cross a predetermined threshold.