The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Apr. 18, 2018
Applicant:

Phase Sensitive Innovations, Inc., Newark, DE (US);

Inventors:

Janusz Murakowski, Bear, DE (US);

Christopher Schuetz, Avondale, PA (US);

Garrett Schneider, New Castle, DE (US);

Shouyuan Shi, Newark, DE (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/2575 (2013.01); H04B 10/69 (2013.01); H04B 10/00 (2013.01);
U.S. Cl.
CPC ...
H04B 10/2575 (2013.01); H04B 10/00 (2013.01); H04B 10/69 (2013.01); H04B 2210/006 (2013.01);
Abstract

A system and method reconstructs RF sources in k-space by utilizing interference between RF signals detected by an array of antennas. The system and method may include detecting an RF interference pattern resulting from interference between RF signals in an RF coupler, where the RF signals are detected by the antennas and provided to the RF coupler by RF waveguides. The RF waveguides may have unequal RF path lengths. K-space information of the RF sources may be reconstructed from the detected RF interference pattern using known tomography reconstruction methods.


Find Patent Forward Citations

Loading…