The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Mar. 26, 2018
Qualcomm Incorporated, San Diego, CA (US);
Seyed Arash Mirhaj, San Diego, CA (US);
Elias Dagher, Laguna Niguel, CA (US);
Yongjian Tang, San Diego, CA (US);
Dinesh Alladi, San Diego, CA (US);
Masoud Ensafdaran, San Diego, CA (US);
Lei Sun, San Diego, CA (US);
Anand Meruva, San Diego, CA (US);
Yuhua Guo, San Diego, CA (US);
Balasubramanian Sivakumar, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Certain aspects of the present disclosure provide methods and apparatus for calibrating time-interleaved analog-to-digital converter (ADC) circuits and generating a suitable signal for such calibration. Certain aspects provide a signal generator for calibrating a time-interleaved ADC circuit having a plurality of channels. The signal generator generally includes a pattern generator configured to receive a periodic signal and to output a bitstream based on the periodic signal and a conversion circuit having an input coupled to an output of the pattern generator and configured to generate a waveform based on the bitstream. The bitstream has a bit pattern with a total number of bits that shares no common factor with a number of the channels and includes a relatively lower frequency component combined with a relatively higher frequency component.