The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Jun. 15, 2017
Applicant:

Facebook Technologies, Llc, Menlo Park, CA (US);

Inventors:

Andrew Matthew Bardagjy, Fremont, CA (US);

Joseph Duggan, San Francisco, CA (US);

Cina Hazegh, Walnut Creek, CA (US);

Fei Liu, San Jose, CA (US);

Mark Timothy Sullivan, Mountain View, CA (US);

Simon Morris Shand Weiss, Redwood City, CA (US);

Assignee:

Facebook Technologies, LLC, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G01B 9/02 (2006.01); G01J 3/10 (2006.01); G01J 3/18 (2006.01); G02B 5/18 (2006.01); G02F 1/33 (2006.01); G03F 7/20 (2006.01); H01S 3/08 (2006.01); G01N 21/47 (2006.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
H01S 3/08009 (2013.01); A61B 5/0059 (2013.01); G01B 9/02091 (2013.01); G01J 3/10 (2013.01); G01J 3/1838 (2013.01); G01N 21/4795 (2013.01); G02B 5/1866 (2013.01); G02F 1/33 (2013.01); G03F 7/2024 (2013.01); G06T 7/521 (2017.01);
Abstract

A wavelength tuning system determines a temperature calibrated to a DOE of a structured light (SL) projector. The wavelength tuning system includes a camera and controller. The camera captures images of a SL pattern projected by the SL projector. The controller generates tuning instruction. The tuning instructions cause a wavelength regulator of the SL projector to set a light source of the SL projector to different temperatures. The tuning instruction also cause the camera to capture images of the structured light pattern at each of the different temperatures. Using at least some of the captured images, the controller determines the temperature calibrated to the DOE. In one embodiment, the temperature calibrated to the DOE corresponds to a wavelength of light emitted by the light source that result in an estimated minimum power of a zeroth order diffracted beam of the SL pattern.


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