The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Jun. 30, 2016
Applicant:
Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;
Inventors:
Assignee:
HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01); G01T 1/28 (2006.01); H01J 43/24 (2006.01); H01J 49/02 (2006.01); H01J 49/06 (2006.01);
U.S. Cl.
CPC ...
H01J 49/025 (2013.01); G01T 1/241 (2013.01); G01T 1/28 (2013.01); H01J 43/24 (2013.01); H01J 49/067 (2013.01); H01J 49/06 (2013.01);
Abstract
A charged particle detector according to the embodiment is provided with an MCP and a PD arranged with a focus electrode interposed therebetween in order to improve a response characteristic as compared to a conventional one in a configuration in which the MCP having a bias angle and the PD are combined. The MCP includes a plurality of through holes each inclined by a bias angle θ and the PD is eccentrically arranged such that a center of an electron incident surface deviates by a predetermined distance in a bias angle direction Swith respect to a central axis AXof the MCP.