The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Jan. 26, 2017
Applicant:

SK Hynix Inc., Icheon-si Gyeonggi-do, KR;

Inventor:

Dae Suk Kim, Icheon-si, KR;

Assignee:

SK hynix Inc., Icheon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/10 (2006.01); G11C 7/22 (2006.01); G11C 29/12 (2006.01); H03K 5/22 (2006.01); G11C 5/04 (2006.01);
U.S. Cl.
CPC ...
G11C 7/22 (2013.01); G11C 7/1078 (2013.01); G11C 29/1201 (2013.01); H03K 5/22 (2013.01); G11C 5/04 (2013.01); G11C 7/1084 (2013.01); H01L 2224/16145 (2013.01); H01L 2924/15192 (2013.01); H01L 2924/15311 (2013.01);
Abstract

An input circuit of a semiconductor apparatus may include a first input buffer configured to receive a signal through a test input terminal and to output a first input signal, a second input buffer configured to receive a signal through a normal input terminal and to output a second input signal. The input circuit of the semiconductor apparatus may include a switching unit configured to transfer the signal inputted through the test input terminal to the second input buffer according to a test mode signal. The input circuit of the semiconductor apparatus may include a comparison unit configured to compare the first input signal with the second input signal and to generate a comparison signal, and a storage unit configured to store the comparison signal.


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