The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Jun. 30, 2010
Kangying Cai, Beijing, CN;
Weiwei LI, Beijing, CN;
Zhibo Chen, Beijing, CN;
InterDigital VC Holdings, Inc., Wilmington, DE (US);
Abstract
Discovering repetitive structures in 3D models is a challenging task. A method for detecting repetitive structures in 3D models comprises sampling the 3D model using a current sampling step size, detecting repetitive structures and remaining portions of the model, determining a representative for each of the one or more repetitive structures, and as long as the detecting step yields one or more repetitive structures, reducing the current sampling step size and repeating the steps of sampling and detecting for each detected representative of a detected repetitive structure and for the remaining portions of the model, wherein the reduced sampling step size is used. The described method and device can e.g. be used for 3D model compression, 3D model repairing, or geometry synthesis.