The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Aug. 15, 2015
Applicant:
Fei Company, Hillsboro, OR (US);
Inventors:
Jeremy James Holt, Farrer, AU;
Andrew Maurice Kingston, Holder, AU;
Adrian Paul Sheppard, Fisher, AU;
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G06T 7/11 (2017.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06T 11/008 (2013.01); G06K 9/6218 (2013.01); G06K 9/6277 (2013.01); G06T 7/11 (2017.01); G06T 11/006 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30181 (2013.01); G06T 2211/408 (2013.01); G06T 2211/424 (2013.01);
Abstract
Provided are improved referenceless multi-material beam hardening correction methods, with an emphasis on maintaining data quality for real-world imaging of geologic materials with a view towards automation. A referenceless post reconstruction (RPC) correction technique is provided that applies the corrections in integrated attenuation space. A container-only pre-correction technique also is provided to allow automation of the segmentation process required for beam hardening correction methods.