The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Dec. 03, 2015
Canon Kabushiki Kaisha, Tokyo, JP;
Masafumi Takimoto, Kawasaki, JP;
Yusuke Mitarai, Tokyo, JP;
Katsuhiko Mori, Kawasaki, JP;
Tomotaka Fujimori, Yokohama, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
To present a determination result with respect to input data and also a reason of the determination result to a user, an extraction unit configured to extract a plurality of feature amounts from an image including an inspection target object, a determination unit configured to determine an anomaly degree of the inspection target object on the basis of the extracted feature amounts, and an image generation unit configured to generate a defect display image representing a defect included in the inspection target object on the basis of contribution degrees of the respective feature amounts with respect to the determined anomaly degree are provided.