The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Jan. 05, 2018
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Freddy Lecue, Dublin, IE;

Chahrazed Bouhini, Dublin, IE;

Benedikt M. Golla, Dublin, IE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06Q 10/10 (2012.01); G06N 3/04 (2006.01); G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/101 (2013.01); G06N 3/04 (2013.01); G06Q 10/063112 (2013.01); G06Q 10/063114 (2013.01);
Abstract

According to an example, with respect to software product development defect and issue prediction and diagnosis, worker profile information and worker state information for a plurality of workers involved in development of a product may be ascertained. A general worker signature that includes a plurality of clusters for all of the plurality of workers may be generated. For each of the plurality of workers, an individual worker signature vector that represents at least one cluster of the plurality of clusters that an individual worker is aligned to may be generated. A product signature vector may be generated based on product state information. Further, an output that includes an explanation for a defect associated with the development of the product may be generated based on a neural network model based analysis of the individual worker signature vectors and the product signature vector over a temporal dimension.


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Lecue, Freddy. (2019). Software product development defect and issue prediction and diagnosis (U.S. Patent No. 10311404). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10311404

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