The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Jul. 01, 2016
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Stefan Walz, Sinzheim, DE;

Joachim Liebler, Heidelberg, DE;

Birgit Oettinger, Rauenberg, DE;

Martin Vogt, Mannheim, DE;

Frank Emminghaus, Mühlhausen, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/06313 (2013.01); H04L 67/1097 (2013.01);
Abstract

A commit event to a database table of a first set of database tables, of a distributed database system, can be detected. The first set of database tables can have a set of first table characteristic and the commit event can have a set of commit event characteristics. The commit event can be correlated to a database table of a second set of database tables based on the set of commit event characteristics. The commit event can be assigned a state based on the correlation of the commit event to a database table of the second set of database tables. First and second documents associated with the commit event can be generated. The second document can be based on the state of the commit event and can include adjustment information associated with the commit event and the first document.


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