The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Mar. 22, 2018
Applicant:

Sas Institute Inc., Cary, NC (US);

Inventors:

Namita Dilip Lokare, Cary, NC (US);

Jorge Manuel Gomes da Silva, Durham, NC (US);

Ilknur Kaynar Kabul, Apex, NC (US);

Gregory Naisat, Chicago, IL (US);

Assignee:

SAS INSTITUTE INC., Cary, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06N 20/00 (2019.01);
Abstract

A computing device provides a cluster connectivity graph presented on a display to summarize machine learning model performance. A classification value is predicted is predicted for a response variable value of each observation vector using a trained model. Observation vectors are divided into overlapping data slices that are separately clustered using the predicted classification value to define a set of clusters. A number of observations in each cluster is computed. An accuracy measure is computed for each cluster based on the predicted classification value. A number of overlapping observations between each pair of clusters is computed. The cluster connectivity graph includes a node for each cluster. A size of each node is determined from the computed number of observations. A fill-pattern of each node is determined from the computed accuracy measure. A connector line between each pair of nodes is determined from the computed number of overlapping observations.


Find Patent Forward Citations

Lokare, Namita. (2019). Analytic system for graphical interpretability of and improvement of machine learning models (U.S. Patent No. 10311368). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10311368

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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