The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Dec. 20, 2016
Eyelock Llc, New York, NY (US);
Stephen Charles Gerber, Austin, TX (US);
Craig Carroll Sullender, Austin, TX (US);
Eyelock LLC, New York, NY (US);
Abstract
Described embodiments include systems and methods for acquiring iris biometric data. An optical entrance of an optical medium may receive a ray incident on the optical entrance, the ray comprising biometric data. An interface of the optical medium with a second medium may receive the received ray at a first angle greater than a critical angle of the interface to enable total internal reflection of the received incident ray. A reflective coating, prism or other mechanism may be used in place of the interface to redirect the received ray or bend the optical path of the received ray. An optical exit of the optical medium may couple the reflected or redirected ray to a sensor for acquiring the biometric data. The ray may be incident on the optical entrance at a second angle relative to an axis of the sensor that is less than 90 degrees.