The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Mar. 07, 2014
Nec Corporation, Minato-ku, Tokyo, JP;
Masanao Natsumeda, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
In invariant relation analysis, a correlation diagram with improved visibility is obtained. A system analysis device () includes a correlation model storage unit (), and the display control unit (). The correlation model storage unit () stores the correlation model expressing correlations between metrics in the system. The display control unit () divides a display region into n divided regions such that an area of a divided region i (1≤i≤n) is equal to or larger than an area of a divided region i+1. The display control unitallocates each of the plurality of clusters obtained by tracking correlations contained in the correlation model to the divided region i sequentially selected from i=1, in the decreasing order of the number of metrics contained in each of the clusters, in such a way that the allocated number increases in accordance with increase in i. The display control unitdraws the cluster allocated to the respective divided region i in the divided region i.