The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Nov. 06, 2015
Sap SE, Walldorf, DE;
Yuanzhen Ji, Dresden, DE;
Zbigniew Jerzak, Berlin, DE;
Anisoara Nica, Waterloo, CA;
Gregor Hackenbroich, Dresden, DE;
SAP SE, Walldorf, DE;
Abstract
The present disclosure involves systems, software, and computer implemented methods for providing quality-driven processing of out-of-order data streams based on a configurable quality metric. In one example, the method includes identifying a configurable quality metric defined by a user or application for executing continuous queries over a sliding window, the metric specifying a user requirement for the quality of the continuous query result. A quality threshold metric is calculated based on the configurable quality metric, the configurable quality metric associated with a size of an adaptation buffer for incoming tuples of the query. In response to receiving a signal indicating a new query result, a sliding window prior to a current time is identified. A runtime quality metric associated with the incoming tuples for the sliding window is measured, and the adaptation buffer is modified based on a difference between the quality threshold metric and the measured runtime quality metric.