The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Feb. 12, 2018
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Xue Dong Gao, Shanghai, CN;
Yang Liu, Shanghai, CN;
Mei Mei, Shanghai, CN;
Hai Bo Qian, Shanghai, CN;
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 1/20 (2006.01); G06F 1/3206 (2019.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 1/206 (2013.01); G06F 1/3206 (2013.01); G06F 11/073 (2013.01);
Abstract
Embodiments of the present invention provide systems and methods for dynamically modifying data scrub rates based on RAID analysis. The method includes determining a grouping for an array based on a temperature for the array, a configurable threshold temperature range for the array, and an I/O distribution of the array. The method further includes modifying the data scrub rate for the array based on the grouping.