The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Oct. 05, 2018
Applicant:

Canon Medical Systems Corporation, Otawara-shi, JP;

Inventors:

Yi Qiang, Vernon Hills, IL (US);

Xiaoli Li, Buffalo Grove, IL (US);

Evren Asma, Buffalo Grove, IL (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/00 (2006.01); G01T 1/166 (2006.01); G01T 1/202 (2006.01); G01T 1/164 (2006.01);
U.S. Cl.
CPC ...
G01T 1/1663 (2013.01); G01T 1/1648 (2013.01); G01T 1/202 (2013.01);
Abstract

A method and apparatus are provided for positron emission imaging to correct a position at which a gamma ray was detected, when the gamma ray is scattered during detection. When Compton scattering occurs during detection of a gamma ray, the energy of the gamma ray deposited in multiple crystals in an array of detector elements. The corrected position is determined as a weighted sum of the position of the multiple crystals, each weighted by an inverse of the energy measured at the respective crystal. Further, the inverse-energy weight can be raised to a power p. A minimum energy threshold can be applied to determine the multiple crystals at which the gamma ray energy is deposited. The corrected position can be a floating position or can be rounded to a nearest crystal or to a nearest virtual sub-crystal.


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