The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Jul. 23, 2016
Renesas Electronics Corporation, Tokyo, JP;
Yuichi Okuda, Tokyo, JP;
Hideo Nakane, Tokyo, JP;
Takaya Yamamoto, Tokyo, JP;
Keisuke Kimura, Tokyo, JP;
Takashi Oshima, Tokyo, JP;
RENESAS ELECTRONICS CORPORATION, Tokyo, JP;
Abstract
The present invention provides a semiconductor device and a failure detection method capable of detecting an excessive variation among elements that constitute an analog circuit as a failure. According to an embodiment, a semiconductor deviceincludes: an AD converter; a digital assist circuitthat corrects an error of a digital signal Do corresponding to an analog signal Ain processed by the AD converter; and a failure detection circuitthat detects whether the AD converterhas a failure based on a correction amount by the digital assist circuit. The semiconductor deviceis therefore able to detect the excessive variation among the elements that constitute the AD converteras a failure.