The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Jan. 18, 2017
Samsung Electronics Co., Ltd., Suwon-si, KR;
Jin-sub Kim, Seoul, KR;
Raghavendra Putti, Suwon-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
A magnetic resonance imaging (MRI) apparatus and a method of detecting an error of the MRI apparatus are provided. The MRI apparatus includes a radio frequency (RF) coil configured to transmit and receive an RF signal, a bias circuit configured to tune and detune the RF coil, and a monitoring circuit configured to monitor a parameter among a bias voltage and a bias current of the bias circuit, based on a monitoring pattern. The MRI apparatus further includes a controller configured to determine whether the bias circuit is in an abnormal state, based on a determination criteria and the monitored parameter, and either one or both of the monitoring pattern and the determination criteria vary based on a status of the bias circuit.