The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Mar. 29, 2017
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Lawrence H. Rubin, Austin, TX (US);

David C. Tannenbaum, Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/317 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31704 (2013.01); G01R 31/31705 (2013.01); G06F 11/00 (2013.01);
Abstract

According to one general aspect, an apparatus may include an interconnect bus, an interconnect-to-debug bus interface, and a debug bus. The interconnect bus may be configured to connect and manage combinatorial logical blocks during normal operation of a processor and operate synchronous to a core clock. The interconnect-to-debug bus interface may be configured to translate communications between the interconnect bus and the debug bus. The debug bus may include a plurality of debug wrapper circuits arranged in a daisy chain for unidirectional communication, and configured to operate synchronous to the core clock. Each of the plurality of debug wrapper circuits may be configured to: identify if the respective debug wrapper circuit is activated by the debug bus, receive a non-invasive input from a respective combinatorial logic block, and place the non-invasive input from the respective combinatorial logic block on the debug bus.


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