The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Mar. 25, 2014
Yissum Research Development Company of the Hebrew University of Jerusalem Ltd., Jerusalem, IL;
Technion Research & Development Foundation Limited, Haifa, IL;
Amir Sa'ar, Mevasseret Zion, IL;
Ester Segal, Haifa, IL;
Abstract
A system for detecting target elements such as bacteria in a host analyte, comprising a substrate with an ordered array of wells having diameters to fit the size of the targets. The substrate may be a periodic macro-PSi array structure (MPSiAS) illuminated with a broadband source. The reflected light spectrum diffracted from the substrate is optically analyzed to provide the effective optical depth of the wells. Fast Fourier Transform analysis may be used for the optical analysis. Entry of target elements into wells is detected by the change in the effective optical depths of the wells. Micro-organisms as large as bacteria and viruses having dimensions comparable with the wavelength of the illumination can thus be detected. Wells with an inner section impenetrable by the target cells enables compensation for environmental changes. The detection may be performed in real time, such that production line bacterial monitoring may be achieved.