The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Mar. 29, 2017
Cécile Brütt, Paris, FR;
Guillaume Painchaud-april, Quebec, CA;
Chi-hang Kwan, Mississauga, CA;
Benoit Lepage, Quebec, CA;
Cécile Brütt, Paris, FR;
Guillaume Painchaud-April, Quebec, CA;
Chi-Hang Kwan, Mississauga, CA;
Benoit Lepage, Quebec, CA;
OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC, Walthan, MA (US);
Abstract
Disclosed is an ultrasonic non-destructive testing and inspection system and method for determining acoustic velocities in a test object. Beams of acoustic energy from firing an element of an emitting probe propagate in a first wedge, and a beam incident at the critical angle generates a surface wave in the test object. The surface wave propagates to a second wedge and signals are received at receiving elements of a receiving probe array. When a set of appropriate delays is applied to the receiving elements, the acoustic time-of-flight is the same to all receiving elements. Determination of the appropriate delays and the times-of-flight for P-type surface waves and Rayleigh surface waves enables computation of the P- and S-wave acoustic velocities in the test object. The time-of-flight measurement also enables computation of the separation between the first and second wedges.