The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Sep. 21, 2015
Applicant:

Dh Technologies Development Pte. Ltd., Singapore, SG;

Inventors:

John Lawrence Campbell, Milton, CA;

Eva Duchoslav, Toronto, CA;

Yves Le Blanc, Newmarket, CA;

David M. Cox, Toronto, CA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/26 (2006.01); G01N 27/62 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
G01N 27/624 (2013.01); H01J 49/004 (2013.01); H01J 49/0031 (2013.01); H01J 49/0036 (2013.01); H01J 49/0045 (2013.01);
Abstract

Systems and methods are provided for providing a DMS precursor ion survey scan. An ion source configured to receive a sample is instructed to ionize the sample using a processor. A DMS device configured to receive ions from the ion source is instructed to separate precursor ions received from the ion source and transmit precursor ions using two or more CoVs using the processor. A mass analyzer configured to receive transmitted precursor ions from the DMS device is instructed to measure the m/z intensities of the transmitted precursor ions across an m/z range at each CoV of the two or more CoVs using the processor. The measured m/z intensities of the transmitted precursor ions received from the mass analyzer are stored as a function of m/z value and CoV using the processor. This produces a stored two-dimensional mapping of m/z intensities of the precursor ions of the sample.


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