The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Sep. 28, 2015
Applicant:
Purdue Research Foundation, West Lafayette, IN (US);
Inventors:
Garth Jason Simpson, West Lafayette, IN (US);
Paul David Schmitt, Zionsville, IN (US);
Assignee:
PURDUE RESEARCH FOUNDATION, West Lafayette, IN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/65 (2006.01); G01N 23/207 (2018.01); G01N 21/63 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); G01N 21/636 (2013.01); G01N 23/207 (2013.01); G01N 2223/606 (2013.01); G01N 2223/612 (2013.01);
Abstract
A method for quantifying crystallinity within a sample using second harmonic generation microscopy is described herein. In one aspect, a method for reducing the timeframe for accelerated stability testing of amorphous solid dispersions of active pharmaceutical ingredients though identifying regions of interest to quantify crystallinity and composition is presented herein.