The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Apr. 24, 2017
Huazhong University of Science and Technology, Wuhan, Hubei, CN;
Xiangyou Li, Hubei, CN;
Meng Shen, Hubei, CN;
Zhongqi Hao, Hubei, CN;
Xinyan Yang, Hubei, CN;
Jiaming Li, Hubei, CN;
Xiaoyan Zeng, Hubei, CN;
Yongfeng Lu, Hubei, CN;
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY, Wuhan, Hubei, CN;
Abstract
The present invention belongs to the technical field of elemental analysis, and more particularly, relates to a dynamic calibration method for echelle spectrometer in laser-induced breakdown spectroscopy, comprising: S1: collecting a standard light source by using an echelle spectrometer; S2: in combination with a calibration function, calculating a pixel position coordinate ({circumflex over (x)},ŷ) corresponding to a spectral wavelength ŵ; S3: performing dynamic searching and filtering near the pixel position coordinate ({circumflex over (x)},ŷ) to obtain a set D of all pixel position coordinates, and adjusting all original intensity values in the set D to obtain intensity values F(I), and S4: calculating a spectral line intensity value after dynamic calibration by summing the adjusted intensity values F(I), thereby completing dynamic calibration of the result of the echelle spectrometer. The method in the present invention can overcome the shortcoming, i.e., the existing echelle spectrometer is only calibrated before measurement without solving the spectral line drift during use, increasing the absolute intensity of the wavelength and reducing the detection limit of the quantitative analysis, as well as improving the precision of the quantitative analysis of an element to be analyzed.