The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Mar. 22, 2017
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Tsugio Gomi, Fujimi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/10 (2006.01); B41J 13/00 (2006.01); G01J 3/50 (2006.01); G01J 3/26 (2006.01);
U.S. Cl.
CPC ...
B41J 13/0009 (2013.01); G01J 3/021 (2013.01); G01J 3/0202 (2013.01); G01J 3/027 (2013.01); G01J 3/0289 (2013.01); G01J 3/10 (2013.01); G01J 3/26 (2013.01); G01J 3/50 (2013.01); G01J 2003/102 (2013.01);
Abstract

A measurement device includes a light source that radiates an illumination light on a measurement object; and a measurement unit that measures a measurement light that is reflection light obtained by the illumination light being reflected by the measurement object or transmitted light obtained by the illumination light passing through the measurement object. The illumination light is a plurality of illumination lights. In a case where the measurement object is positioned at a reference position, an illumination center at which an optical axis of each of the plurality of illumination lights and the measurement object intersect, and a measurement center that is a center of a measurement region of the measurement object measured by the measurement unit are positioned at different positions.


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