The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Jan. 24, 2013
Elekta Ab, Stockholm, SE;
Elekta AB, Stockholm, SE;
Abstract
The present invention introduces a method, device and a computer program for removing artifacts present in individual channels of a multichannel measurement device. At first, a basis is generated defining an n-dimensional subspace of the N-dimensional signal space, where n is smaller than N, where using in the definition of the n-dimensional basis a physical model of a Signal Space Separation method, or a statistical model based on the statistics of recorded N-dimensional signals. Thereafter, a combined (n+m)-dimensional basis is formed by adding m signal vectors to the n-dimensional basis, each of these m signal vectors representing a signal present only in a single channel of the N-channel device. After this the recorded N-dimensional signal vector is decomposed into n+m components in the combined basis, and finally, components corresponding to the m added vectors in the combined basis are subtracted from the recorded N-dimensional signal vector.