The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Mar. 26, 2015
Applicant:
Lg Electronics Inc., Seoul, KR;
Inventors:
Assignee:
LG Electronics Inc., Seoul, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/0205 (2006.01); A61B 5/024 (2006.01); A61B 5/1455 (2006.01); A61B 5/145 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0205 (2013.01); A61B 5/0077 (2013.01); A61B 5/024 (2013.01); A61B 5/1455 (2013.01); A61B 5/14532 (2013.01); A61B 5/681 (2013.01); A61B 5/742 (2013.01); A61B 5/6826 (2013.01); A61B 2562/046 (2013.01);
Abstract
The present invention provides a measuring apparatus comprising: a light source unit; and a sensor unit configured to sense a plurality of properties to be measured with respect to an object by using light emitted from the light source unit, wherein the sensor unit comprises: a first region configured to sense a first property to be measured among the plurality of properties to be measured by sensing the light within a first wavelength range; and a second region configured to sense a second property to be measured among the plurality of properties to be measured by sensing the light within a second wavelength range that is different from the first wavelength range.