The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Aug. 16, 2016
Samsung Electronics Co., Ltd., Suwon-si, KR;
Seung Jun Lee, Seoul, KR;
Dong Ho Kim, Seoul, KR;
Jung Mok Bae, Seoul, KR;
Eui Seok Shin, Yongin-si, KR;
Woo Chang Lee, Anyang-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
An optical measuring device including a light source, a light beam path adjuster, a light detector and a controller is provided. The light source may emit light toward an object in a predetermined progress direction. The light beam path adjuster may be disposed between the light source and the object and may change a progress path of the light emitted from the light source. The light detector may receive the light that is reflected from the object after passing through the light beam path adjuster. The controller may compare a first effective beam path length of the reflected light that the light detector receives with a predetermined target beam path length and control a refractive angle of the light beam path adjuster based on a beam path length difference between the first effective beam path length and the predetermined target beam path length.