The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Jan. 19, 2017
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 7/33 (2017.01); G06T 11/60 (2006.01); G02B 27/32 (2006.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); G02B 27/32 (2013.01); G06T 7/33 (2017.01); G06T 11/60 (2013.01); G06T 7/74 (2017.01); G06T 7/75 (2017.01); G06T 2207/10024 (2013.01); G06T 2207/30208 (2013.01);
Abstract
An information processing apparatus: obtains a feature distribution by calculating a distribution of features, existing in an environment, that can be used to measure a position and orientation of a measurement viewpoint; decides on a feature pattern to be laid out and a layout position of the feature pattern in the environment that enable the obtainment of a feature distribution that enhances an accuracy at which the position and orientation of the measurement viewpoint is calculated; and presents the feature pattern and the layout position of the feature pattern that have been decided on.