The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Jun. 01, 2017
Applicants:
Krishna Prasad Agara Venkatesha Rao, Bangalore, IN;
Srinidhi Srinivasa, Bangalore, IN;
Inventors:
Krishna Prasad Agara Venkatesha Rao, Bangalore, IN;
Srinidhi Srinivasa, Bangalore, IN;
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/20 (2006.01); G06T 5/00 (2006.01); G06T 5/40 (2006.01);
U.S. Cl.
CPC ...
G06T 5/20 (2013.01); G06T 5/002 (2013.01); G06T 5/40 (2013.01);
Abstract
The location of the optical axis of a plenoptic imaging system is determined. In one approach, the plenoptic image is noise filtered, down-sampled, low-pass filtered, and again noise filtered. Slices through this image that have the highest power are used to determine the location of the optical axis. Once the location of the optical axis is determined, corrections for aberrations such as distortion can be applied.