The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

Jun. 28, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Aaron K. Baughman, Silver Spring, MD (US);

Phaedra K. Boinodiris, Apex, NC (US);

Barry M. Graham, Silver Spring, MD (US);

Russell R. Vane, Herndon, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06N 7/00 (2006.01); G06N 20/00 (2019.01); G06Q 10/06 (2012.01); G06N 99/00 (2019.01); G06Q 50/00 (2012.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06N 5/047 (2013.01); G06N 20/00 (2019.01); G06N 99/005 (2013.01); G06Q 10/06 (2013.01); G06N 5/04 (2013.01); G06Q 50/01 (2013.01);
Abstract

A system, method and program product for optimizing a team to solve a problem. The system includes: a team building system for building a fundamental analytic team from a database of analysts to solve an inputted problem, wherein the fundamental analytic team includes at least one cluster of analysts characterized with specificity and at least one cluster of analysts characterized with sensitivity; and a problem analysis system that collects sensor data from the fundamental analytic team operating within an immersive environment, wherein the problem analysis system includes a system for evaluating the sensor data to identify a bias condition from the fundamental analytic team, and includes a system for altering variables in the immersive environment in response to a detected bias condition.


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