The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

Sep. 14, 2015
Applicant:

T0.com, Inc., Midvale, UT (US);

Inventors:

Tron Black, Salt Lake City, UT (US);

Alec Wilkins, Salt Lake City, UT (US);

Robert Christensen, Salt Lake City, UT (US);

Assignee:

t0.com, Inc., Midvale, UT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 21/60 (2013.01); G06F 21/64 (2013.01); H04L 9/32 (2006.01);
U.S. Cl.
CPC ...
G06F 21/602 (2013.01); G06F 21/64 (2013.01); H04L 9/3239 (2013.01); H04L 9/3297 (2013.01); H04L 2209/38 (2013.01);
Abstract

Systems and methods described herein generally relate to storing and verifying data. In some embodiments, reference levels are generated according to time intervals, where the first reference level comprises a predetermined number of the time intervals, and where each of the time intervals of the remaining reference levels is comprised of a predetermined number of the time intervals of a previous reference level. Hashes of data can be created at the first reference level by performing a hashing function on the data in a time-sequenced manner. First reference level time interval hashes may be generated by performing the hashing function on the hashes of the data at each of the time intervals of the first reference level. Hashes for remaining reference level time intervals can be generated by performing the hashing function on the hashes of each of the time intervals of the previous reference level.


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