The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Dec. 10, 2012
Hercules Incorporated, Wilmington, DE (US);
Konstantin Abraham Vaynberg, Cherry Hill, NJ (US);
Jennifer M. Buckley, Newark, DE (US);
Matthew Reuben Durst, Simsbury, CT (US);
Brian Owens, West Simsbury, CT (US);
Stephen James Weathers, Media, PA (US);
Daniel Appel Wilkins, Saint Leonard, MD (US);
Hercules LLC, Wilmington, unknown;
Abstract
A product testing assembly is described. The product testing assembly may include a substrate, at least one measuring device, and at least one data processing system. The substrate has at least one surface configured to receive an application of a product to be tested. The at least one measuring device is configured to sense measured quantities as product is applied to the substrate and output one or more signals representative of a sequence of forces and/or moments being applied to the surface of the substrate by the application of the product to be tested. The at least one data processing system has one or more processors configured to receive the one or more signals representative of the sequence of forces and/or moments being applied to the surface of the substrate, and to convert the one or more signals into an output signal representative of one or more application performance characteristics of the product to be tested.