The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

Aug. 15, 2016
Applicant:

Sas Institute Inc., Cary, NC (US);

Inventors:

Jun Liu, Cary, NC (US);

Ruiwen Zhang, Cary, NC (US);

Zheng Zhao, Cupertino, CA (US);

Assignee:

SAS INSTITUTE INC., Cary, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 17/11 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01); G06F 17/11 (2013.01); G06N 20/00 (2019.01);
Abstract

Processing speeds for generating a model can be enhanced. For example, the model can be generated by using regression coefficient values as weights for independent variables in the model. The regression coefficient values can be determined using a coordinate descent method to find a minimum value of a least absolute shrinkage and selection operator cost function. Each iteration of the coordinate descent method can include determining a starting coordinate based on (i) a previous starting coordinate or a previous regression coefficient value from an immediately prior iteration of the coordinate descent method; (ii) a current regression coefficient value associated with a current iteration of the coordinate descent method; and (iii) a refinement factor configured to minimize a result of a univariate algorithm. Each iteration can also include performing a coordinate descent using the starting coordinate to determine a next regression coefficient value for a next iteration of the coordinate descent method.


Find Patent Forward Citations

Loading…