The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Jun. 29, 2016
Yale University, New Haven, CT (US);
Derek K. Toomre, New Haven, CT (US);
Brian T. McNellis, Waterbury, CT (US);
Yale University, New Haven, CT (US);
Abstract
A method for analyzing spatial point patterns and visualizing the results is presented. The method includes simulating at least one point set within a region using a point process, dividing the region into a plurality of elements, determining scores for both real data and simulated data for each element by weighting the point sets within a domain of a predetermined kernel. The method further includes comparing scores for each element, computing confidence intervals for at least one confidence level having a predetermined statistical significance; and providing a visualization to identify clusters and exclusion zones.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile