The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

Sep. 30, 2015
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Guilherme Menezes, Santa Clara, CA (US);

Fabiano Botelho, San Ramon, CA (US);

Abdullah Reza, Santa Clara, CA (US);

Assignee:

EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 16/182 (2019.01); G06F 11/14 (2006.01); G06F 16/11 (2019.01); G06F 16/9535 (2019.01);
U.S. Cl.
CPC ...
G06F 16/1844 (2019.01); G06F 11/1451 (2013.01); G06F 11/1456 (2013.01); G06F 11/1464 (2013.01); G06F 16/125 (2019.01); G06F 16/9535 (2019.01); G06F 2201/84 (2013.01);
Abstract

In one example, a method for processing data includes receiving information that identifies an ad-hoc group of size 'n' of files F. . . F, each file F including a respective segment set S, and then sampling a representation of each unique segment in the segment set S to obtain a sampled unique segment count for each file F. A unique segment count is then obtained for each file F by applying a sampling ratio R to each sampled unique segment count, and an average segment size for each file F is determined. Next, a physical space measurement is generated for each file F based on the average segment size and the unique segment count, and then a total physical space measurement p is generated based on the individual physical space measurements for each file F.


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