The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

Sep. 25, 2015
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Mikael Peres, Raanana, IL;

Yariv Amar, Ramla, IL;

Oded Peer, Ranana, IL;

Tomer Meidan, Ramat-Gan, IL;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/54 (2006.01);
U.S. Cl.
CPC ...
G06F 9/542 (2013.01); G06F 9/546 (2013.01);
Abstract

Parallel processing of events having multi-dimensional dependencies is provided. Each event has at least one profile and each profile has at least one profile key. An event is dependent on another event if they have at least one common profile key. The profile key(s) for a plurality of profiles of the given event are compared to profile keys of previously queued events. A given event is assigned to a same queue as at least one dependent event. When a given event is dependent on events in at least two queues, the given event is not assigned to a queue until only one queue has dependent events remaining to be processed. A list of profile keys that have been assigned to each queue and/or a reference count of a number of events that have been queued for each profile key are optionally maintained.


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