The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

Oct. 25, 2017
Applicant:

Olympus Corporation, Hachioji-shi, Tokyo, JP;

Inventors:

Tatsuo Nakata, Tokyo, JP;

Kenichi Kusaka, Brookline, MA (US);

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/02 (2006.01); G02B 21/08 (2006.01); G02B 21/24 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/02 (2013.01); G02B 21/002 (2013.01); G02B 21/0076 (2013.01); G02B 21/025 (2013.01); G02B 21/08 (2013.01); G02B 21/24 (2013.01); G02B 21/248 (2013.01); G02B 21/361 (2013.01);
Abstract

To provide a microscope including: an objective optical system that condenses light from a sample; a relay optical system that relays the light condensed by the objective optical system; a photodetector detects the light coming from the objective optical system and relayed by the relay optical system; and a variable-focus optical system disposed at a position between the photodetector and the objective optical system, the position being optically conjugate to a pupil of the objective optical system, the variable-focus optical system being capable of changing a focal position of the objective optical system in a direction along an objective optical axis.


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