The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

Dec. 31, 2012
Applicant:

Halliburton Energy Services, Inc., Houston, TX (US);

Inventors:

Ferhat Turker Celepcikay, Houston, TX (US);

Burkay Donderici, Houston, TX (US);

Luis Emilio San Martin, Houston, TX (US);

Junsheng Hou, Kingwood, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/38 (2006.01); G01V 1/48 (2006.01); G01V 3/02 (2006.01); G01V 99/00 (2009.01); G01V 3/20 (2006.01);
U.S. Cl.
CPC ...
G01V 3/38 (2013.01); G01V 1/48 (2013.01); G01V 3/20 (2013.01); G01V 99/00 (2013.01); G01V 3/02 (2013.01);
Abstract

In some embodiments, an apparatus and a system, as well as a method and an article, may operate to calculate a map that transforms fast modeled measurement results into accurate modeled measurement results within a modeled data space, to make actual measurements using a tool disposed in a borehole, to transform a plurality of modeling parameter vectors into the fast modeled measurement results via modeling, to transform the fast modeled measurement results into the accurate modeled measurement results using the map, to locate a matching modeling parameter vector as one of the plurality of modeling parameter vectors that matches the accurate modeled measurement results to the actual measurement, and to display at least a portion of the matching modeling parameter vector to represent at least one property of a geological formation. Additional apparatus, systems, and methods are described.


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Celepcikay, Ferhat. (2019). Measurement correction apparatus, methods, and systems (U.S. Patent No. 10302803). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10302803

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