The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

Jul. 12, 2012
Applicants:

Shanjun LI, Katy, TX (US);

Luis E. San Martin, Houston, TX (US);

Burkay Donderici, Houston, TX (US);

Inventors:

Shanjun Li, Katy, TX (US);

Luis E. San Martin, Houston, TX (US);

Burkay Donderici, Houston, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/20 (2006.01); E21B 47/10 (2012.01); G01V 3/22 (2006.01);
U.S. Cl.
CPC ...
G01V 3/20 (2013.01); E21B 47/102 (2013.01); G01V 3/22 (2013.01);
Abstract

A system and method for improving the accuracy of galvanic tool measurements is described. The system () may include a survey electrode (A) and a first monitor electrode (M) positioned above the survey electrode. A second monitor electrode (M) may be positioned below the survey electrode, and a first conductive wire () may couple the first monitor electrode to the second monitor electrode. A first measurement point () may be located on the conductive wire, and a first resistive element (R) may be coupled to the conductive wire.


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