The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

Dec. 19, 2016
Applicant:

Vista Clara Inc., Mukilteo, WA (US);

Inventor:

David O. Walsh, Mukilteo, WA (US);

Assignee:

VISTA CLARA INC., Mukilteo, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/58 (2006.01); G01R 33/44 (2006.01); G01R 33/46 (2006.01); G01N 24/08 (2006.01);
U.S. Cl.
CPC ...
G01R 33/583 (2013.01); G01N 24/081 (2013.01); G01R 33/441 (2013.01); G01R 33/4625 (2013.01); G01R 33/448 (2013.01);
Abstract

Technologies applicable to NMR spin-echo amplitude estimation are disclosed. Example methods may calibrate for distortion of a shape and estimated amplitude of measured NMR spin or gradient echoes. NMR spin or gradient echo measurements may be performed on a sample. The measured NMR spin or gradient echoes may be used to calculate an echo-shape calibration factor. The echo-shape calibration factor may estimate an effect of echo shape on estimated spin or gradient echo amplitude(s) of the NMR spin or gradient echoes. The echo-shape calibration factor may be used to correct for underestimation or overestimation of the spin or gradient echo amplitude(s).


Find Patent Forward Citations

Loading…